Sp Dft

Product Description

A comprehensive solution for automated testing of digital ICs, supporting the full scan-test cycle from design to verification. The platform automatically generates and optimizes scan architecture, test vectors, and fault coverage analysis, ensuring high testing efficiency. Integration with industry EDA tools enables DFT methodologies to be applied at early design stages, shortening time-to-market. The solution supports modern test standards and is suited for complex digital designs including processors and custom ICs.